High precision scanning angle ellipsometry

作者: R. C. van Duijvenbode , E. A. van der Zeeuw , G. J. M. Koper

DOI: 10.1063/1.1368862

关键词:

摘要: A home-built computer-controlled scanning angle ellipsometer setup is presented, together with a detailed method to derive the ellipsometric parameters ψ and Δ by applying null ellipsometry. The high positioning accuracy obtained stepper motors long path length make it possible assess various alignment methods. Some of methods proposed in literature do not give enough apply precision measurements. As reflectometer, levels reflection amplitudes as low 10−4.5 can be determined. In ellipsometry, intensity located using simplex algorithm including corrections for angular beam deviations caused component imperfections. With presented maximum only achieved four-zone averaging measurements, compensator fast axis fixed at 45°. four polarizer combinations different zones lead variations up 20° incidence angles close Brewster angle. first-order analysis co...

参考文章(15)
HP William, PF Brian, AT Saul, TV William, Numerical Recipes in Pascal ,(1989)
H. G. Liljenvall, A. G. Mathewson, Two Alignment Methods for the Polarizer and Analyzer in an Ellipsometer Applied Optics. ,vol. 9, pp. 1489- 1490 ,(1970) , 10.1364/AO.9.001489
R. M. A. Azzam, N. M. Bashara, Unified Analysis of Ellipsometry Errors Due to Imperfect Components, Cell-Window Birefringence, and Incorrect Azimuth Angles* Journal of the Optical Society of America. ,vol. 61, pp. 600- 607 ,(1971) , 10.1364/JOSA.61.000600
René C. van Duijvenbode, Ger J. M. Koper, Marcel R. Böhmer, Adsorption of Poly(propylene imine) Dendrimers on Glass. An Interplay between Surface and Particle Properties Langmuir. ,vol. 16, pp. 7713- 7719 ,(2000) , 10.1021/LA000231J
R. M. A. Azzam, Stanley S. Ballard, N. M. Bashara, Ellipsometry and polarized light ,(1977)
T. Dabroś, T. G. M. van de Ven, A direct method for studying particle deposition onto solid surfaces Colloid and Polymer Science. ,vol. 261, pp. 694- 707 ,(1983) , 10.1007/BF01415042
P. Drude, Bestimmung der optischen Constanten der Metalle Annalen der Physik und Chemie. ,vol. 275, pp. 481- 554 ,(1890) , 10.1002/ANDP.18902750402
M Ghezzo, Method for calibrating the analyser and the polarizer in an ellipsometer Journal of Physics D. ,vol. 2, pp. 1483- 1485 ,(1969) , 10.1088/0022-3727/2/10/420