Reflection characterization of anisotropic ultrathin dielectric films on absorbing isotropic substrates

摘要: The reflection of linearly polarized light from an ultrathin anisotropic dielectric film on isotropic absorbing substrate is investigated analytically in the long-wavelength limit. All analytical results are correlated with numerical solution problem basis rigorous electromagnetic theory. Simple approach developed this work not only gives a physical insight into but also provides way estimating necessary experimental accuracy for optical diagnostics by characteristics. It shown that obtained expressions immediate interest determining parameters surface layers. Innovative possibilities properties layers upon materials discussed.