作者: Y. Xiang , C. Reuterskiöld-Hedlund , X. Yu , C. Yang , T. Zabel
DOI: 10.1364/OE.23.015680
关键词:
摘要: We report on the design, fabrication and analysis of vertical-cavity surface-emitting transistor-lasers (T-VCSELs) based homogeneous integration an InGaAs/GaAs VCSEL AlGaAs/GaAs pnp-heterojunction bipolar transistor (HBT). Epitaxial regrowth confinement, modulation doping, intracavity contacting non-conducting mirrors are used to ensure a low-loss structure, variety design variations investigated for proper internal biasing current injection wide operating range. Optimized devices show mW-range output power, mA-range base threshold high-temperature operation at least 60°C with in its active mode currents well beyond threshold. Current confinement schemes pnp-blocking layers or buried tunnel junction as asymmetric reduced extrinsic resistances.