作者: Kazuyoshi Tanaka , Satoru Nishio , Yukihito Matsuura , Tokio Yamabe
DOI: 10.1016/0379-6779(94)90114-7
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摘要: Abstract In association with the study of recent plasma-polymerized organic semiconductive materials, electron spin resonance (ESR) measurements have been performed in order to analyze intrinsic structural property focusing on π-radical spins formed process plasma polymerization and exposure air as post-plasma reaction. Behavior its parallelism electrical conduction carriers are discussed.