Diffusion kinetics and mechanical behavior of lead-free microbump solder joints in 3D packaging applications

作者: B. S. S. Chandra Rao , V. Kripesh , K. Y. Zeng

DOI: 10.1109/ECTC.2011.5898498

关键词:

摘要: … commercial solders for the reflow bonding process due to their … total IMC thickness for Sn/Cu solder joints of different sizes … hardness of Cu3Sn in the 70μm Cu/ SnAgCu/Cu joint. Fig.12 …

参考文章(14)
B. Salam, N.N. Ekere, D. Rajkumar, Study of the interface microstructure of Sn-Ag-Cu lead-free solders and the effect of solder volume on intermetallic layer formation electronic components and technology conference. pp. 471- 477 ,(2001) , 10.1109/ECTC.2001.927769
Luhua Xu, John H.L. Pang, Nano-indentation characterization of Ni–Cu–Sn IMC layer subject to isothermal aging Thin Solid Films. ,vol. 504, pp. 362- 366 ,(2006) , 10.1016/J.TSF.2005.09.056
Luwei Liu, Mingliang Huang, Effect of solder volume on interfacial reactions between Sn3.5Ag0.75Cu solder balls and cu pad international conference on electronic packaging technology. pp. 299- 304 ,(2010) , 10.1109/ICEPT.2010.5582332
Kejun Zeng, Roger Stierman, Tz-Cheng Chiu, Darvin Edwards, Kazuaki Ano, K. N. Tu, Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability Journal of Applied Physics. ,vol. 97, pp. 024508- ,(2005) , 10.1063/1.1839637
D. L. Joslin, W. C. Oliver, A new method for analyzing data from continuous depth-sensing microindentation tests Journal of Materials Research. ,vol. 5, pp. 123- 126 ,(1990) , 10.1557/JMR.1990.0123
K. M. Chen, Impact of packaging materials on reliability test for low-K wire bond-stacked flip chip CSP Journal of Materials Science: Materials in Electronics. ,vol. 20, pp. 484- 489 ,(2009) , 10.1007/S10854-008-9756-4
Guh-Yaw Jang, Jyh-Wei Lee, Jeng-Gong Duh, The nanoindentation characteristics of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds in the solder bump Journal of Electronic Materials. ,vol. 33, pp. 1103- 1110 ,(2004) , 10.1007/S11664-004-0111-0
K.S. Kim, S.H. Huh, K. Suganuma, Effects of intermetallic compounds on properties of Sn–Ag–Cu lead-free soldered joints Journal of Alloys and Compounds. ,vol. 352, pp. 226- 236 ,(2003) , 10.1016/S0925-8388(02)01166-0
J. P. Lucas, H. Rhee, F. Guo, K. N. Subramanian, Mechanical properties of intermetallic compounds associated with Pb-free solder joints using nanoindentation Journal of Electronic Materials. ,vol. 32, pp. 1375- 1383 ,(2003) , 10.1007/S11664-003-0104-4
Yang Shihua, Lin Pengrong, Tian Yanhong, Wang Chunqing, Liang Le, Wang Qian, Effect of Solder Volume on Shear Strength between Sn-3.0Ag-0.5Cu Solder and Cu Metallization international conference on electronic packaging technology. pp. 1- 4 ,(2007) , 10.1109/ICEPT.2007.4441532