摘要: Qualitative interpretation of X-ray data simply requires that the energy (or wavelength) observed peaks be compared with energies characteristic elements. The quantitative from thin samples differs similar thick in several ways. whole following discussion will based on assumption have been obtained a film using an EDX rather than WDX system. Clearly underlying principles are identical to those for bulk analysis or detectors. is more involved and major differences between foil discussed Section 6.3 also covered Chapter 2.
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On the production of characteristic X-rays in thin metal crystals Proceedings of The Royal Society A: Mathematical, Physical and Engineering Sciences. ,vol. 295, pp. 140- 163 ,(1966) , 10.1098/RSPA.1966.0231
I. P. Jones, M. H. Loretto, Some aspects of quantitative STEM X-ray microanalysis* Journal of Microscopy. ,vol. 124, pp. 3- 13 ,(1981) , 10.1111/J.1365-2818.1981.TB01300.X
L M Brown, Scanning transmission electron microscopy: microanalysis for the microelectronic age Journal of Physics F: Metal Physics. ,vol. 11, pp. 1- 26 ,(1981) , 10.1088/0305-4608/11/1/007
S.J.B. Reed, The single-scattering model and spatial resolution in X-ray analysis of thin foils Ultramicroscopy. ,vol. 7, pp. 405- 409 ,(1982) , 10.1016/0304-3991(82)90263-7
J.C.H. Spence, Uniqueness and the inversion problem of incoherent multiple scattering Ultramicroscopy. ,vol. 4, pp. 9- 12 ,(1979) , 10.1016/0304-3991(79)90004-4
A. W. Nicholls, I. P. Jones, A review of on-line processing of chemical analysis data using a conventional CTEM/STEM Journal of Microscopy. ,vol. 127, pp. 119- 126 ,(1982) , 10.1111/J.1365-2818.1982.TB00402.X
R. F. Egerton, M. J. Whelan, The electron energy loss spectrum and band structure of diamond Philosophical Magazine. ,vol. 30, pp. 739- 749 ,(1974) , 10.1080/14786437408207231
R. Hutchings, M.H. Loretto, I.P. Jones, R.E. Smallman, Spatial resolution in x-ray microanalysis of thin foils in stem Ultramicroscopy. ,vol. 3, pp. 401- 405 ,(1978) , 10.1016/S0304-3991(78)80062-X
David C. Joy, Dennis M. Maher, The quantitation of electron energy loss spectra Journal of Microscopy. ,vol. 124, pp. 37- 48 ,(1981) , 10.1111/J.1365-2818.1981.TB01303.X
R.F. Egerton, K-shell ionization cross-sections for use in microanalysis Ultramicroscopy. ,vol. 4, pp. 169- 179 ,(1979) , 10.1016/S0304-3991(79)90157-8