Automatic test equipment operating architecture
作者： William A. Fritzsche
DOI:
关键词:
摘要: An integrated circuit testing device, such as an ATE, configured with architecture comprising a distinct software layer and hardware interface for tester abstraction providing communication conduit between the layer. The communicates in device under test terms whereas of apparatus. Various points are provided to layers, well abstraction.
lens.org 参考文章(5)
William A. Fritzsche, Frederick Giral, Michael F. Jones, Circuit testing with ring-connected test instrument modules ,(2004)
Kamran Zarrineh, Thomas J. Eckenrode, R. Dean Adams, Steven L. Gregor, Programable multi-port memory bist with compact microcode ,(2003)
Geoffrey Outhred, Kevin Grealish, Bassam Tabbara, Rob Mensching, Galen C. Hunt, Architecture for distributed computing system and automated design, deployment, and management of distributed applications U.S. Patent. ,(2005)
William Fritzsche, Carroll Carruth, Clark Jones, Stephen Roehling, Oliver Knight, System and method for linking and loading compiled pattern data ,(2004)
William A. Fritzsche, Howard M. Maassen, Thomas P. Ho, Joseph C. Helland, Socket calibration method and apparatus ,(2000)