Method and system for controlling interchangeable components in a modular test system

作者: Ankan Pramanick , Mark Elston , Toshiaki Adachi

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摘要: A method for integrating test modules in a modular system is disclosed. The includes controlling at least one module and its corresponding device under test, DUT, with controller, establishing standard control interface between vendor-supplied the framework, installing software module, where organized into plurality of components, configuring based on framework accessing accordance components using framework.

参考文章(28)
Alan C. Noble, ATE test programming architecture ,(1996)
S.M. Perez, The consequences of an open ATE architecture international test conference. pp. 1210- ,(2002) , 10.1109/TEST.2002.1041915
Edmundo De la Puente, Alan S Krech, Joel Buck-Gengler, Algorithmically programmable memory tester with test sites operating in a slave mode ,(2001)
John William Bailey, Paul Alan Hayter, Brian Robert Mason, Graham Norman Turner, Dinesh Kargathra, Ian Robert Fisher, John Jervis Comfort, Automatic test equipment ,(1984)
B.G. West, Open ATE architecture: key challenges international test conference. pp. 1212- 1213 ,(2002) , 10.1109/TEST.2002.1041917
S.M. Perez, Y. Furukawa, Open architecture test system: the new frontier international electronics manufacturing technology symposium. pp. 211- 214 ,(2003) , 10.1109/IEMT.2003.1225902
Ankan Pramanick, Mark Elston, Harsanjeet Singh, Toshiaki Adachi, Yoshifumi Tahara, Method and structure to develop a test program for semiconductor integrated circuits ,(2005)
D.R. Conti, Mission impossible? Open architecture ATE international test conference. pp. 1207- ,(2002) , 10.1109/TEST.2002.1041912