作者: Ştefan Ţălu , Miroslaw Bramowicz , Slawomir Kulesza , Atefeh Ghaderi , Vali Dalouji
DOI: 10.1007/S13391-016-6036-Y
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摘要: This paper analyses the three-dimensional (3-D) surface texture of Cu/Co thin films deposited by DC-Magnetron sputtering method on silicon substrates. The prepared nanoparticles were used as research materials. Three groups samples substrates in argon atmosphere and gradually cooled down to room temperature. crystalline structures elemental compositions analyzed X-ray diffraction (XRD) spectrum with conventional Bragg-Brentano geometry. profile indicates that Co Cu interpenetrating are formed these films. sample images recorded using atomic force microscopy (AFM) means fractal Statistical, functional properties computed describe major characteristics spatial nanoparticles. Presented deposition is a versatile, costeffective, simple synthesize nano- microstructures type 3-D morphology allows understand structure/property relationships investigate defect-related results confirm possibility preparing high-quality via