作者: Gary W. Stupian , Martin S. Leung
DOI: 10.1063/1.1140458
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摘要: A scanning tunneling microscope (STM) that uses a motorized micrometer to provide for coarse mechanical motion of the specimen relative tip is described. The attached directly spindle. No additional reduction mechanisms, such as levers, are necessary. After positioning optically about 0.2–0.3 mm from specimen, current established automatically under control system computer by sequence motions combined with extensions tubular piezoelectric scanner. Tunneling typically acquired in 10–15 min.