作者: A. De Vos , P. De Visschere
DOI: 10.1016/0379-6787(83)90008-X
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摘要: It is well known that a moderate sheet resistance of the emitter layer solar cell can be modelled as lumped series resistance. has no influence on open-circuit voltage and little short-circuit current. The model enables fill factor loss to calculated. In present paper it shown large leads current-voltage (I–V) characteristics which are not type but instead display presence “light-dependent shunt resistance”. This qualitative diagnosis an important distributed completed using two quantitative diagnostic methods: determination cell, measurement intersection V axis with tangent I–V characteristic at point. latter quantity, we call “short-circuit voltage”, turns out equal about twice voltage, whereas in range 30% – 38%.