The analysis of field-ion micrographs: Stacking faults in tungsten

摘要: Abstract It is shown how the images of stacking faults in b.c.c. metals can be analysed field-ion micrographs. The method analysis applied to some observations tungsten. A mixed dislocation lying close [142] direction and with Burgers vector a/2[11·1] have dissociated twice. on {110} planes accord either dissociation proposed by Cohen–Crussard or that Wasilewski–Foxall. tentative value for stacking-fault energy tungsten γ≃50 ergs cm−2 obtained, suspected presence impurity segregation.