Recent Advances in LEEM/PEEM for Structural and Chemical Analysis
作者： E. Bauer , T. Franz , C. Koziol , G. Lilienkamp , T. Schmidt
DOI: 10.1007/978-94-011-5724-7_5
关键词:
摘要: Non-scanning surface electron microscopy with slow emitted and reflected electrons is slowly approaching the goals set more than five years ago. This paper discusses mainly present state of art imaging a multimethod instrument which allows LEED, LEEM, MEM various emission microscopies without energy filtering, using or photons as primary species. It includes also brief comparison spin-polarized LEEM pure microscopy.
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