Chapter 7 Critical Technologies for the Micromachining of Silicon

作者: Don L. Kendall , Charles B. Fleddermann , Kevin J. Malloy

DOI: 10.1016/S0080-8784(08)62519-3

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摘要: Publisher Summary This chapter discusses critical technologies for the micromachining of silicon. “Micromachining” is a term generally applied to wide range three-dimensional (3-D) structures that can be fabricated using techniques originally developed microelectronics industry. Principally, revolves around single-crystal or polycrystalline silicon (Si), although associated materials such as oxides, nitrides, glasses, polymeric materials, and metals are also necessary used. Other semiconductors III–V compound subject investigations. Various mechanisms wet-chemical anisotropic etching discussed in depth chapter. includes several very recent topics, innovative electrochemical thinning porous Si. New data presented on chemical formation micromirrors Si GaAs surfaces. The multiple use substrate (MU-STRATE) some detail possible means reaching into terabit/cm 3 logic element density. A method (signal-induced feedback treatment) analog e-beam testing actively modifying up billion devices few minutes way MU-STRATE.

参考文章(115)
Daniel J Ehrlich, Jeffrey Y Tsao, None, Laser microfabrication : thin film processes and lithography Academic Press. ,(1989)
Carol I. H. Ashby, Laser‐induced etching Advances in Laser Science-II: Proceedings of the 2nd International Laser Science Conference. ,vol. 160, pp. 586- 593 ,(1987) , 10.1063/1.36825
Linus Pauling, The Nature of the Chemical Bond ,(1939)
H. Seidel, L. Csepregi, A. Heuberger, H. Baumgärtel, Anisotropic Etching of Crystalline Silicon in Alkaline Solutions I . Orientation Dependence and Behavior of Passivation Layers Journal of The Electrochemical Society. ,vol. 137, pp. 3612- 3626 ,(1990) , 10.1149/1.2086277
O. Tabata, R. Asahi, H. Funabashi, S. Sugiyama, Anisotropic etching of silicon in (CH/sub 3/)/sub 4/NOH solutions TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers. pp. 811- 814 ,(1991) , 10.1109/SENSOR.1991.149007
R. G. GOSSINK, SIMS Analysis of a Field‐Assisted Glass‐to‐Metal Seal Journal of the American Ceramic Society. ,vol. 61, pp. 539- 540 ,(1978) , 10.1111/J.1151-2916.1978.TB16146.X
W. P. Maszara, G. Goetz, A. Caviglia, J. B. McKitterick, Bonding of silicon wafers for silicon‐on‐insulator Journal of Applied Physics. ,vol. 64, pp. 4943- 4950 ,(1988) , 10.1063/1.342443
R. Stengl, K.-Y. Ahn, U. Gösele, Bubble-Free Silicon Wafer Bonding in a Non-Cleanroom Environment Japanese Journal of Applied Physics. ,vol. 27, pp. L2364- L2366 ,(1988) , 10.1143/JJAP.27.L2364
M. Kimura, K. Egami, M. Kanamori, T. Hamaguchi, Epitaxial film transfer technique for producing single crystal Si film on an insulating substrate Applied Physics Letters. ,vol. 43, pp. 263- 265 ,(1983) , 10.1063/1.94320