Secondary-ion mass spectrometry of particle beams

作者: Phillip E. Sanders

DOI: 10.1002/RCM.1290040407

关键词:

摘要: A particle beam liquid chromatography/mass spectrometry interface has been developed which interfaces to a secondary-ion mass ion source. High flow rates (e.g., 0.5–2.0 mL/min) have achieved with sensitive performance. Matrix compounds were added through the particle-beam interface. cesium gun is used as source of primary ions.

参考文章(1)
Justin G. Stroh, J. Carter. Cook, Richard M. Milberg, Larry. Brayton, Tsuyoshi. Kihara, Zhaogeng. Huang, Kenneth L. Rinehart, Ivor A. S. Lewis, On-line liquid chromatography/fast atom bombardment mass spectrometry Analytical Chemistry. ,vol. 57, pp. 985- 991 ,(1985) , 10.1021/AC00283A006