Concurrent off-phase built-in self-test of dormant logic
作者： L.J. Sigal , C.R. Kime
关键词:
摘要: Concurrent off-phase built-in self-test is described, which permits the operation of hardware designed for offline testing concurrently with normal system operations. It takes advantage logic dormancy characteristic designs use two-phase clocking. This method provides online detection permanent faults and can be used in conjunction a time-redundant concurrent test to detect transient intermittent as well faults. Also, guaranteed self-checking circuits. BIST requires duplication storage elements but otherwise makes noncurrent, testing. there may an associated time penalty which, given example CMOS technology symmetric phase clock period 50 ns, estimated 11.6% increase period. >
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