A sigma-delta modulation based BIST scheme for mixed-signal circuits
作者： Jiun-Lang Huang , Kwang-Ting Cheng
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摘要: In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on sigma-delta modulation principle, proposed can produce high-quality stimuli obtain accurate measurements without need precise analog circuitry. Numerical simulations are conducted validate our idea results show promising BIST approach circuits.
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