On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy
作者： Sławomir Kret , Paweł Dłużewski , Piotr Dłużewski , Jean-Yves Laval
DOI: 10.1080/0141861021000020095
关键词:
摘要: Tensorial maps of misfit dislocations at the strained GaAs-ZnTe-CdTe interfacial zone are reconstructed by use digital processing high-resolution transmission electron micrographs. Large distortions crystal lattice around Lomer measured using geometric phase technique. The integration dislocation distribution tensor field over a core region gives in-plane components their Burgers vectors. accuracy method for map reconstruction is tested comparing theoretical values so-called true vectors with those obtained from tensorial maps.
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