A genetic approach to automatic bias generation for biased random instruction generation

作者: M. Bose , Jongshin Shin , E.M. Rudnick , T. Dukes , M. Abadir

DOI: 10.1109/CEC.2001.934425

关键词:

摘要: Biased random instruction generators are commonly used in architectural verification of microprocessors, with biases specified manually by designers. As the complexity processors grows, so does specifying biases. Automatic bias generation speeds up flow and may lead to better coverage potential design errors. In this work, we present a genetic algorithm based framework automatically generate We target utilization specific buffers for new version PowerPC architecture. Our results show that GA is effective achieving high buffer utilization. Also, targeting multiple objectives, best approach use depends on whether objectives related.

参考文章(10)
Ta-Chung Chang, Vikram Iyengar, Elizabeth M. Rudnick, A Biased Random Instruction Generation Environmentfor Architectural Verification of Pipelined Processors microprocessor test and verification. ,vol. 16, pp. 13- 27 ,(2000) , 10.1023/A:1008311916502
Aarti Gupta, Sharad Malik, Pranav Ashar, Toward formalizing a validation methodology using simulation coverage Proceedings of the 34th annual conference on Design automation conference - DAC '97. pp. 740- 745 ,(1997) , 10.1145/266021.266359
Mike Benjamin, Daniel Geist, Alan Hartman, Gerard Mas, Ralph Smeets, Yaron Wolfsthal, A study in coverage-driven test generation design automation conference. pp. 970- 975 ,(1999) , 10.1145/309847.310108
Scott Taylor, Michael Quinn, Darren Brown, Nathan Dohm, Scot Hildebrandt, James Huggins, Carl Ramey, Functional verification of a multiple-issue, out-of-order, superscalar Alpha processor—the DEC Alpha 21264 microprocessor design automation conference. pp. 638- 643 ,(1998) , 10.1145/277044.277208
Raanan Grinwald, Eran Harel, Michael Orgad, Shmuel Ur, Avi Ziv, User defined coverage—a tool supported methodology for design verification design automation conference. pp. 158- 163 ,(1998) , 10.1145/277044.277081
Shmuel Ur, Yaov Yadin, Micro architecture coverage directed generation of test programs design automation conference. pp. 175- 180 ,(1999) , 10.1145/309847.309909
Laurent Fournier, Anatoly Koyfman, Moshe Levinger, Developing an architecture validation suite: application to the PowerPC architecture design automation conference. pp. 189- 194 ,(1999) , 10.1145/309847.309911
A. Chandra, V. Iyengar, D. Jameson, R. Jawalekar, I. Nair, B. Rosen, M. Mullen, J. Yoon, R. Armoni, D. Geist, Y. Wolfsthal, AVPGEN-A test generator for architecture verification IEEE Transactions on Very Large Scale Integration Systems. ,vol. 3, pp. 188- 200 ,(1995) , 10.1109/92.386220
A. Aharon, A. Bar-David, B. Dorfman, E. Gofman, M. Leibowitz, V. Schwartzburd, Verification of the IBM RISC System/6000 by a dynamic biased pseudo-random test program generator IBM Systems Journal. ,vol. 30, pp. 527- 538 ,(1991) , 10.1147/SJ.304.0527
Elizabeth Marie Rudnick, Judith Elizabeth Laurens, William C. Bruce, Wai-on Law, Method and apparatus for generating instructions for use in testing a microprocessor ,(1996)