Ellipsometry with Non-Ideal Compensators
作者： R. J. Archer , C. V. Shank
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摘要: The lack of equivalence between polarizer extinction aximuths in different zones is the result relative amplitude attenuation some mica wave plates. A dependence transmittance on orientation electric-field vector to compensator axes caused either by interference, or pleochroism, both. Experimental data establish these conclusions. correct method for interpreting measurements made with such non-ideal compensators presented.
osapublishing.org参考文章(4)
R. J. Archer, Determination of the Properties of Films on Silicon by the Method of Ellipsometry Journal of the Optical Society of America. ,vol. 52, pp. 970- 977 ,(1962) , 10.1364/JOSA.52.000970
A. B. Winterbottom, Optical Determination of Thin Films on Reflecting Bases in Transparent Environments Journal of the Optical Society of America. ,vol. 38, pp. 1074- 1082 ,(1948) , 10.1364/JOSA.38.001074
H. Weinberger, J. Harris, Interference Effect in Quarter-Wave Plates Journal of the Optical Society of America. ,vol. 54, pp. 552- 553 ,(1964) , 10.1364/JOSA.54.000552
Frank L. McCrackin, Elio Passaglia, Robert R. Stromberg, Harold L. Steinberg, Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry Journal of Research of the National Bureau of Standards Section A: Physics and Chemistry. ,vol. 67A, pp. 363- 377 ,(1963) , 10.6028/JRES.067A.040