Assessing and mitigating radiation effects in Xilinx SRAM FPGAs

作者: Philippe Adell , Gregory Allen , Gary Swift , Steve McClure

DOI: 10.1109/RADECS.2008.5782755

关键词:

摘要: This work intends to help designers assess and mitigate radiation effects in systems that use SRAM-based FPGAs. Several methodologies combining experimental procedure, mitigation strategies technical aspects are discussed.

参考文章(8)
G.M. Swift, S. Rezgui, J. George, C. Carmichael, M. Napier, J. Maksymowicz, J. Moore, A. Lesea, R. Koga, T.F. Wrobel, Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs) IEEE Transactions on Nuclear Science. ,vol. 51, pp. 3469- 3474 ,(2004) , 10.1109/TNS.2004.839190
M. Sonza Reorda, L. Sterpone, M. Violante, Efficient estimation of SEU effects in SRAM-based FPGAs international on line testing symposium. pp. 54- 59 ,(2005) , 10.1109/IOLTS.2005.26
F.G. de Lima Kastensmidt, G. Neuberger, R.F. Hentschke, L. Carro, R. Reis, Designing fault-tolerant techniques for SRAM-based FPGAs IEEE Design & Test of Computers. ,vol. 21, pp. 552- 562 ,(2004) , 10.1109/MDT.2004.85
H. Quinn, P. Graham, Terrestrial-based radiation upsets: a cautionary tale field-programmable custom computing machines. pp. 193- 202 ,(2005) , 10.1109/FCCM.2005.61
Brian Pratt, Michael Caffrey, Paul Graham, Keith Morgan, Michael Wirthlin, Improving FPGA Design Robustness with Partial TMR international reliability physics symposium. pp. 226- 232 ,(2006) , 10.1109/RELPHY.2006.251221
H. Quinn, P. Graham, J. Krone, M. Caffrey, S. Rezgui, Radiation-induced multi-bit upsets in SRAM-based FPGAs IEEE Transactions on Nuclear Science. ,vol. 52, pp. 2455- 2461 ,(2005) , 10.1109/TNS.2005.860742
J. George, R. Koga, G. Swift, G. Allen, C. Carmichael, C.W. Tseng, Single Event Upsets in Xilinx Virtex-4 FPGA Devices radiation effects data workshop. pp. 109- 114 ,(2006) , 10.1109/REDW.2006.295477