Image simulation of partially amorphous materials

摘要: Abstract The extent to which the aperiodic character of HRTEM images corresponds amorphous domains in partially materials has not been determined. Neither spatial nor quantitative correspondence between image and actual structure quantified. This complicates complete interpretation wherever are present. In this study, periodic continuation employed model large-scale defects (i.e. domains) within crystalline zircon (ZrSiO 4 ) order determine accuracy phase-contrast imaging process when applied materials. simulations show that increasing proportions laterally homogeneous layers material contribute intensity non-linearly, such apparent accumulation is compressed relative accumulation. Up thirty percent a sample can be before observable disruption periodicity occurs image, loss volume fraction drops below twenty percent. Within range fractions, exhibit character; however, exact structural transition gives rise depends on thickness. Increasing crystal thickness decreases sensitivity volumes. Laterally discontinuous regions an spatially only crystalline/amorphous (C/A) interface vertical parallel electron beam). Non-vertical C/A interfaces give gradational changes from consistent with changing columnar across interface. may significant errors volumetric estimate derived analysis inhomogeneous, samples. Proper areas exhibiting mixed periodic/ character, does allow accurate determination for 30 80 amorphous.