Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light
作者： Fengtao Wang , Fuhan Liu , Gee-Kung Chang , Ali Adibi
DOI: 10.1117/1.2842390
关键词:
摘要: We present a reliable, nondestructive, and real-time technique for characterization of propagation properties planar optical waveguides based on accurately imaging the scattered light from waveguide using sensitive charge-coupled device (CCD) camera with built-in integration functionality. This can be used investigation (loss, mode profile, bending properties, etc.) as well fabrication quality waveguides. With this technique, we evaluate high-definition polymer printed circuit board (PCB) substrates very low loss 0.065 dB/cm at wavelength 850 nm, measurement accuracy is less than 0.01 dB/cm. expect given CCD to suitable reliably measuring coefficients below 0.1
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