作者: Jared F. Bauters , Martijn J. R. Heck , Demis D. John , Jonathon S. Barton , Christiaan M. Bruinink
DOI: 10.1364/OE.19.024090
关键词:
摘要: … Reflectometry is widely used in fiber optics to probe the local reflectivity of waveguides and … radiation loss, which theoretically has an exponential dependence on bend radius [24], or …