作者: Sung-Hae Lee , Jin-Gyun Kim , Ki-Hyun Hwang
DOI:
关键词:
摘要: A method of manufacturing a non-volatile memory device, wherein the includes: alternately stacking interlayer sacrificial layers and insulating on substrate; forming plurality first openings that pass through to expose portion semiconductor region side wall lower surface each openings; an embedded layer in conductive inside second opening exposing substrate impurity portion; metal cover region; into silicide layer.