Method of propagation delay testing a functional logic system

摘要: Propagation delay testing is performed on a generalized and modular logic system that utilized as an arithmetic/logical unit in digital computer. Each of computer formed arrangements combinational networks storage circuitry. The circuitry has the capability for performing scan-in/scan-out operations independently input/output controls. Using this scan capability, method invention provides state to be preconditioned independent its prior history. Selected propagation paths through are sensitized by test patterns from automatic generator. By altering selected inputs cycling controls applied their respective associated circuitry, indications obtained determine status these path delays system.