90 nm CMOS RF technology with 9.0 V I/O capability for single-chip radio

作者: G. Baldwin , J. Ai , K. Benaissa , F. Chen , P.R. Chidambaram

DOI: 10.1109/VLSIT.2003.1221099

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摘要: In this article, an industry leading 21 mask count 90nm CMOS SoC technology with integrated RF, analog, dense memory, low power or high-speed logic, and high-voltage DEMOS options is demonstrated. RF analog characteristics high on-chip voltage capability enable single chip radio design as well many additional applications.

参考文章(1)
H.S. Momose, E. Morifuji, T. Yoshitomi, T. Ohguro, M. Saito, H. Iwai, Cutoff frequency and propagation delay time of 1.5-nm gate oxide CMOS IEEE Transactions on Electron Devices. ,vol. 48, pp. 1165- 1174 ,(2001) , 10.1109/16.925243