Everything SAXS: Small-angle scattering pattern collection and correction

摘要: For obtaining reliable nanostructural details of large amounts sample --- and if it is applicable Small-Angle Scattering (SAS) a prime technique to use. It promises obtain bulk-scale, statistically sound information on the morphological nanostructure, has thus led many researcher investing their time in over last eight decades development. Due pressure both from scientists requesting more increasingly complex nanostructures, as well ever improving instrumentation leaving less margin for ambiguity, small-angle scattering methodologies have been evolving at high pace few decades. As quality any results can only be good data that goes into these methodologies, improvements collection all imaginable correction steps are reviewed here. This work intended provide comprehensive overview corrections, aid scatterer decide which relevant measurement how corrections performed. Clear mathematical descriptions provided where feasible. Furthermore, no exists without decent estimate its precision, error estimation propagation through alongside corrections. With collected pattern made highest standard allowing authoritative characterisation analysis. A brief background scattering, developments years, pitfalls may encountered upon interpretations well.