Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests
作者： Said Hamdioui , Zaid Al-Ars , Ad J. van de Goor , Mike Rodgers
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摘要: The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverage and low cost. This paper describes an important class, called dynamic faults, that cannot be ignored anymore. behavior can take place in the absence static behavior, for which conventional memory have been constructed. concept will established validated both Random-Access-Memories. A systematic way develop models faults introduced. Further, it shown do not necessarily detect its faulty has exist real designs. therefore also presents new target class.
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tudelft.nl 参考文章(25)
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