The relationship between crystal growth and defect structure: a study of potassium hydrogen phthalate using x-ray topography and atomic force microscopy

摘要: An investigation of the defect structure crystals potassium hydrogen phthalate (KAP) and its relationship to crystallization behaviour has been carried out using x-ray diffraction topography atomic force microscopy (AFM). Crystals KAP grown from aqueous solution were found exhibit very low densities in range 5 15 cm-2 remarkably levels strain. The character distribution dominant growth dislocation types determined topography. most significant features a tendency for certain nucleate pairs at sector boundaries. X-ray revealed sectorial variations solvent inclusions complementary use AFM shown this spiral anisotropy on (010) face crystals. Changes crystal morphology have observed which result extreme density, leading either or, case dislocation-free sectors, two-dimensional nucleation mechanism. bending dislocations one another material are discussed context size-dependent rates.