High Temperature Operated Enhancement-Type β -SiC MOSFET

作者: Hiroo Fuma , Atsushi Miura , Hiroshi Tadano , Susumu Sugiyama , Mitsuharu Takigawa

DOI: 10.1143/JJAP.27.L2143

关键词:

摘要: Enhancement-type β-SiC MOSFETs have been fabricated on a single crystalline layer grown 3-inch Si(100) substrate by chemical vapor deposition. The applying the reactive ion etching technique show reasonable I-V characteristics at room temperature. saturation tendency of drain currents has observed voltage as high 18 V. operate even 350°C.

参考文章(1)
Mitsugu Yamanaka, Hiroshi Daimon, Eiichiro Sakuma, Shunji Misawa, Kazuhiro Endo, Sadafumi Yoshida, Temperature Dependence of Electrical Properties of Nitrogen-Doped 3C-SiC Japanese Journal of Applied Physics. ,vol. 26, pp. L533- L535 ,(1987) , 10.1143/JJAP.26.L533