作者: Hiroo Fuma , Atsushi Miura , Hiroshi Tadano , Susumu Sugiyama , Mitsuharu Takigawa
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摘要: Enhancement-type β-SiC MOSFETs have been fabricated on a single crystalline layer grown 3-inch Si(100) substrate by chemical vapor deposition. The applying the reactive ion etching technique show reasonable I-V characteristics at room temperature. saturation tendency of drain currents has observed voltage as high 18 V. operate even 350°C.