作者: Lei Chen , Xiaohui Wang , Bin Qiao , Longtu Li
DOI: 10.1143/JJAP.46.780
关键词:
摘要: The interdiffusion between the Ba(Ti,Zr)O3 (BTZ) dielectric and internal Ni electrode layers in Y5V-type multilayer ceramic capacitors (MLCCs) with an active layer thickness of 5 µm was studied by high-resolution transmission electron microscopy (HRTEM) energy-dispersive spectrometry (EDS) analysis. It found that such leads to formation some defects lattice distortion near interface. diffusion degree into BTZ higher than Ni. In EDS analysis chemical composition confirmed different degrees were verified. generation relationship degradation MLCCs electrodes also studied.