Microstructural, dielectric and magnetic behavior of spin-deposited nanocrystalline nickel–zinc ferrite thin films for microwave applications
作者： Nutan Gupta , A. Verma , Subhash C. Kashyap , D.C. Dube
DOI: 10.1016/J.JMMM.2006.05.015
关键词:
摘要: Abstract Nanocrystalline nickel ferrite and zinc doped thin films with general composition Ni 1− x Zn Fe 2 O 4 ; =0.0, 0.2 0.5 were fabricated by the spin-deposition technique. Citrate precursor method was adopted to prepare coating solution used for film deposition. This resulted in single phase, transparent, homogeneous crack-free nanocrystalline at annealing temperature as low 400 °C. The substrates deposition ITO-coated 7059 glass, fused quartz Si (1 0 0). thickness of found be range ∼1000–5500 A. surface microstructure morphology investigated atomic force microscopy (AFM) confirmed grain size nickel–zinc nanometer indicating nature films. Dielectric properties such real (∈′) imaginary parts (∈″) complex permittivity measured X-band microwave frequency region (8–12 GHz) employing extended cavity perturbation M – H hysteresis measurements on annealed 650 °C revealed narrow curves c s varying different compositions.
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