作者: Matthew T. Johnson , Paul G. Kotula , C.Barry Carter
DOI: 10.1016/S0022-0248(99)00342-5
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摘要: Abstract Epitactic thin films of nickel ferrite spinel (NiFe 2 O 4 ) have been grown on (0 0 0 1) oriented sapphire substrates using pulsed-laser deposition. Three different methods were used to produce the films. The first was direct deposition a stoichiometric NiFe target. In other two methods, solid-state reaction between NiO and Fe 3 utilized spinel. one case, formed in situ while film growth occurred system; NiO/Fe heterostructure reacted ex at elevated temperatures air. resulting analyzed cross section both conventional high-resolution transmission electron microscopy. general, predominant defects found twin boundaries. However, topology boundaries each three different. These differences attributed to, correlated with, method processes film.