作者: Michael G. Mladejovsky , Clark C. Davis , Stephen C. Jacobsen
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摘要: Linear displacement and strain measuring apparatus includes a linearly movable element, an emitter disposed on the element to move as is moved, for developing predetermined paterns of electric fields which vary in direction movement detector close proximity adjacent path moves detect variations field patterns producing output signals representing variation thus linear relative detector. By attaching spaced apart locations specimen, specimen can be measured.