作者: Yusuf S. Hascicek , Steven W. Van Sciver , Huub W. Weijers , David K. Hilton
DOI:
关键词:
摘要: A stress-strain test for conductors. assembly receives first and second conductive layers a dielectric layer adjacent each of the layers. The are generally ring-shaped concentric when received by separates from other. magnetic field source provides to variable current layer. circuit measures change in capacitance between is varied whereby stress strain characteristics determined as function change.