作者: S. Khalid , R. Emrich , R. Dujari , J. Shultz , J. R. Katzer
DOI: 10.1063/1.1136801
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摘要: A laboratory x‐ray absorption spectrometer is described which allows very high quality edge and extended fine structure (EXAFS) data to be obtained. The utilizes a channel‐cut crystal configuration monochromator for studies fully focusing Johansson cut bent monchromator operated on the Rowland circle flux, resolution EXAFS studies. X‐ray generation by rotating anode generator. Photon fluxes are about 104 higher than sealed‐tube flat‐crystal spectrometer; it shown that of comparable obtained from synchrotron source (SSRL) can in time.