Laboratory x‐ray spectrometer for EXAFS and XANES measurements

摘要: An in‐lab x‐ray spectrometer is described which capable of rapid acquisition absorption fine structure data for either extended measurements (EXAFS), or near edge studies (XANES). Intensities in excess 107 photons/s an ∼10 eV bandpass 9 keV have been obtained using only a conventional sealed, fixed anode tube operating at 1.5 kW. The utilizes focusing Johansson cut and bent single crystal as the monochromator scans continuously from 8≲2θ≲160 degrees with stepping motor driven movement. For 3d metal edges, resolutions ∼10eV are first order Ge(111) ∼1 third allowing both EXAFS XANES synchrotron‐like quality.