作者: Chris M. Fancher , Lili Zhao , Matthew Nelson , Ligang Bai , Guoyin Shen
DOI: 10.1063/1.4922717
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摘要: The effect of hydrostatic pressure on the structure Si-doped HfO2 (Si:HfO2) was studied by using a diamond anvil cell in combination with high-energy X-ray diffraction at synchrotron source. Diffraction data were measured situ during compression up to pressures 31 GPa. Si:HfO2 3, 5, and 9 at. % Si found undergo monoclinic orthorhombic transition between 7 15 GPa. Whole pattern analysis carried out nonpolar (Pbca) polar (Pca21) crystallographic models investigate symmetry observed high-pressure phase. Rietveld refinement results cannot discriminate reliable difference Pbca Pca21 structures as they nearly equally model data. dependent lattice parameters, relative volume, spontaneous strain are reported.