作者: Eva Kreysing , Silke Seyock , Hossein Hassani , Elke Brauweiler‐Reuters , Elmar Neumann
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摘要: AO_SCPLOWBSTRACTC_SCPLOWThe investigation of the cell-substrate interface is great importance for a broad spectrum areas such as biomedical engineering, brain-chip interfacing and fundamental research. Due to its unique resolution prevalence instruments, electron microscopy (EM) used one standard techniques analysis interface. However, possible artifacts that might be introduced by required sample preparation have been subject speculation decades. recent advances in Surface plasmon resonance (SPRM), technique now offers label-free alternative characterization with nanometer axial direction. In contrast EM, SPRM studies do not require fixation can therefore performed on living cells. Here, we present workflow allows us quantify impact chemical These measurements confirmed preserved average distances majority studied Furthermore, were able correlate EM images exact same cells allowing identify regions good agreement between two methods reveal during further preparation.