作者: S. Varun , S.C.G. Kiruba Daniel , Sai Siva Gorthi
DOI: 10.1016/J.MSEC.2016.12.011
关键词:
摘要: … Transmission Electron micrographs (TEM) were recorded on a Tecnai G2 F30 S-TWIN HR-TEM (FEI, Hillsboro, USA) operating at 200 kV. The samples were drop casted into 400 mesh …