Accurate electron channeling contrast analysis of dislocations in fine grained bulk materials

作者: H. Mansour , J. Guyon , M.A. Crimp , N. Gey , B. Beausir

DOI: 10.1016/J.SCRIPTAMAT.2014.03.001

关键词:

摘要: Non-destructive, comprehensive dislocations characterization in fine grained Interstitial-Free Steel was realized for the first time by Accurate Electron Channeling Contrast Imaging “A-ECCI” a Scanning Microscope. Conventional Transmission Microscopy g·b = 0 invisibility criterion and trace analysis were applied to determine Burgers vectors line directions this bulk material. This approach relies on live collection of High Resolution Selected Area Patterns “HR-SACPs” using an innovative procedure rock beam with remarkable spatial resolution about 1 μm.

参考文章(21)
F. J. Humphreys, Review Grain and subgrain characterisation by electron backscatter diffraction Journal of Materials Science. ,vol. 36, pp. 3833- 3854 ,(2001) , 10.1023/A:1017973432592
RANGA J. KAMALADASA, FANG LIU, LISA M. PORTER, ROBERT F. DAVIS, DANIEL D. KOLESKE, GREG MULHOLLAND, KENNETH A. JONES, YOOSUF N. PICARD, Identifying threading dislocations in GaN films and substrates by electron channelling. Journal of Microscopy. ,vol. 244, pp. 311- 319 ,(2011) , 10.1111/J.1365-2818.2011.03538.X
Roya Maboudian, Jason Kawasaki, Nicola Ferralis, Carlo Carraro, Evolution in Surface Morphology of Epitaxial Graphene Layers on SiC Induced by Controlled Structural Strain Applied Physics Letters. ,vol. 93, pp. 191916- ,(2008) , 10.1063/1.3028091
A. Weidner, F. Pyczak, H. Biermann, Scanning and transmission electron microscopy investigations of defect arrangements in a two-phase γ-TiAl alloy Materials Science and Engineering A-structural Materials Properties Microstructure and Processing. ,vol. 571, pp. 49- 56 ,(2013) , 10.1016/J.MSEA.2013.01.078
S. Primig, H. Leitner, W. Knabl, A. Lorich, H. Clemens, R. Stickler, Influence of the heating rate on the recrystallization behavior of molybdenum Materials Science and Engineering: A. ,vol. 535, pp. 316- 324 ,(2012) , 10.1016/J.MSEA.2011.12.099
P. Morin, M. Pitaval, D. Besnard, G. Fontaine, Electron–channelling imaging in scanning electron microscopy Philosophical Magazine. ,vol. 40, pp. 511- 524 ,(1979) , 10.1080/01418617908234856