作者: Irving Sheft , Arthur H. Reis , Dieter M. Gruen , Seimer W. Peterson
DOI: 10.1016/0022-3115(76)90002-7
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摘要: Abstract A tensimetric technique has been developed for measuring 15 keV D + trapping in Ti metal. The formation of the TiD 2 phase surface and near-surface regions was monitored by decoupling θ–2θ scan an X-ray diffractometer as well scanning electron microscope studies. Micron-sized ‘reaction zones’ appear to serve nucleation centers phase. Insight into mechanism chemical is obtained correlating results from three types measurements used present work.