Structure of CdS Evaporated Films in Relation to Their Use as Ultrasonic Transducers

摘要: The crystallographic orientation of obliquely evaporated CdS films has been investigated by x‐ray and electron diffraction to provide the information required control fabrication shear mode thin film ultrasonic transducers. Some degree preferred orientation, with c axis normal plane, was observed in initial layers all examined. preference primarily dependent upon structure substrate. As increased thickness, on except highly (111)‐oriented gold substrate, an oblique developed crystallites strongly inclined towards incident vapor beam. On gold‐film substrates, remained c‐axis preferred. effects substrate rate angle deposition have Ultrasonic transducer data are presented compared showing expected correlation between ...