作者: Š. Meškinis , A. Vasiliauskas , K. Šlapikas , G. Niaura , R. Juškėnas
DOI: 10.1016/J.DIAMOND.2013.09.004
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摘要: Abstract In the present study structure of silver containing diamond like carbon (DLC:Ag) films deposited by reactive magnetron sputtering was investigated X-ray diffractometry (XRD) and multiwavelength Raman spectroscopy. case DLC:Ag low amount silver, crystalline oxide prevails over silver. While at higher Ag atomic concentrations formation crystallites different orientations observed. Surface enhanced scattering (SERS) effect detected for high content in films. For UV excited spectra sp 3 bonded related T peak ~ 1060 cm − 1 only with highest (34.3 at.%). The dependence parameters such as position G peak, full width half maximum (FWHM(G)), D/G area ratio on concentration film well excitation wavelength were studied. more pronounced laser beam, while 325 nm 442 nm beams weak (or no dependence) Overall tendency decrease dispersion increase found. Thus /sp 2 bond decreased