作者: Joseph Q. Pham , Peter F. Green
DOI: 10.1063/1.1456035
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摘要: We examined the influence of film thickness and composition on effective Tg compatible thin mixtures polystyrene (PS) tetramethylbisphenol-A polycarbonate (TMPC) SiOx/Si substrates using spectroscopic ellipsometry. Our measurements reveal that while TMPC films increased with decreasing thickness, h, PS decreased thickness. In these mixtures, was independent at large h. also found bulk TMPC/PS exhibited negative deviations from additivity composition, such were negligible in mixtures. The dependence is compared theory.