TEM–EELS investigations of nanoscale multilayers in the linescan mode
作者： K. Wetzig , J. Thomas , H.-D. Bauer , M. Hecker , A. John
DOI: 10.1016/S0368-2048(00)00263-2
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摘要: Abstract Nanoscale multilayers have microstructural and compositional properties which may differ widely from those of bulk materials. Such changes were investigated by EELS in the analytical TEM for different binary multilayer systems. Co/Cu showed a chemical mixing depending on preparation technique. A trend to demixing was observed at annealing. The fine structure O–K edge nanoscale Fe/Al layers enables localized distinction between O bonding Fe Al.
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sci-hub.se 参考文章(5)
Gernot Kostorz, Phase Transformations in Materials ptm. pp. 724- ,(2001)
J�rgen Thomas, Andreas John, Klaus Wetzig, Nanoscale Co/Cu Multilayers Investigated by Analytical TEM and AES Mikrochimica Acta. ,vol. 133, pp. 131- 135 ,(2000) , 10.1007/S006040070082
Marcel Tencé, Marc Quartuccio, Christian Colliex, PEELS compositional profiling and mapping at nanometer spatial resolution Ultramicroscopy. ,vol. 58, pp. 42- 54 ,(1995) , 10.1016/0304-3991(94)00177-O
J. Thomas, Reinhold Rennekamp, Ludwig van Loyen, Characterization of multilayers by means of EDXS in the analytical TEM Fresenius Journal of Analytical Chemistry. ,vol. 361, pp. 633- 636 ,(1998) , 10.1007/S002160050974
S. S. P. Parkin, Z. G. Li, David J. Smith, Giant magnetoresistance in antiferromagnetic Co/Cu multilayers Applied Physics Letters. ,vol. 58, pp. 2710- 2712 ,(1991) , 10.1063/1.104765