Transmission electron microscopy study of metallic multilayers
作者： K. Han , K. Yu-Zhang
DOI: 10.1016/J.SCRIPTAMAT.2003.11.046
关键词: Metastability 、 Materials science 、 Transmission electron microscopy 、 Epitaxy 、 Metal 、 Texture (crystalline) 、 Nanotechnology
摘要: Transmission electron microscopy (TEM) becomes a necessary and routine technique in the examination of texture, epitaxy, metastable phases interface structures metallic multilayers. This paper presents viewpoint study both micro atomic scales by various TEM techniques. � 2003 Acta Materialia Inc. Published Elsevier Ltd. All rights reserved.
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