Origin of Ferroelectric Phase in Undoped HfO2 Films Deposited by Sputtering

作者: Terence Mittmann , Monica Materano , Patrick D. Lomenzo , Min Hyuk Park , Igor Stolichnov

DOI: 10.1002/ADMI.201900042

关键词:

摘要: … to produce stable ferroelectric films over a wide thickness range with high remanent polarization 2P r of 18–20 µC cm −2 without using additional doping. Ferroelectric properties are …

参考文章(41)
Patrick Polakowski, Johannes Müller, Ferroelectricity in undoped hafnium oxide Applied Physics Letters. ,vol. 106, pp. 232905- ,(2015) , 10.1063/1.4922272
T. S. Böscke, J. Müller, D. Bräuhaus, U. Schröder, U. Böttger, Ferroelectricity in hafnium oxide thin films Applied Physics Letters. ,vol. 99, pp. 102903- ,(2011) , 10.1063/1.3634052
Stefan Mueller, Johannes Muller, Uwe Schroeder, Thomas Mikolajick, Reliability Characteristics of Ferroelectric $ \hbox{Si:HfO}_{2}$ Thin Films for Memory Applications IEEE Transactions on Device and Materials Reliability. ,vol. 13, pp. 93- 97 ,(2013) , 10.1109/TDMR.2012.2216269
M. Hoffmann, U. Schroeder, T. Schenk, T. Shimizu, H. Funakubo, O. Sakata, D. Pohl, M. Drescher, C. Adelmann, R. Materlik, A. Kersch, T. Mikolajick, Stabilizing the ferroelectric phase in doped hafnium oxide Journal of Applied Physics. ,vol. 118, pp. 072006- ,(2015) , 10.1063/1.4927805
T.V. Perevalov, V.Sh. Aliev, V.A. Gritsenko, A.A. Saraev, V.V. Kaichev, Electronic structure of oxygen vacancies in hafnium oxide Microelectronic Engineering. ,vol. 109, pp. 21- 23 ,(2013) , 10.1016/J.MEE.2013.03.005
T. S. Böscke, St. Teichert, D. Bräuhaus, J. Müller, U. Schröder, U. Böttger, T. Mikolajick, Phase transitions in ferroelectric silicon doped hafnium oxide Applied Physics Letters. ,vol. 99, pp. 112904- ,(2011) , 10.1063/1.3636434
Uwe Schroeder, Ekaterina Yurchuk, Johannes Müller, Dominik Martin, Tony Schenk, Patrick Polakowski, Christoph Adelmann, Mihaela I. Popovici, Sergei V. Kalinin, Thomas Mikolajick, Impact of different dopants on the switching properties of ferroelectric hafniumoxide Japanese Journal of Applied Physics. ,vol. 53, ,(2014) , 10.7567/JJAP.53.08LE02
Ekaterina Yurchuk, Johannes Müller, Steve Knebel, Jonas Sundqvist, Andrew P. Graham, Thomas Melde, Uwe Schröder, Thomas Mikolajick, Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films Thin Solid Films. ,vol. 533, pp. 88- 92 ,(2013) , 10.1016/J.TSF.2012.11.125
Stefan Mueller, Johannes Mueller, Aarti Singh, Stefan Riedel, Jonas Sundqvist, Uwe Schroeder, Thomas Mikolajick, Incipient Ferroelectricity in Al-Doped HfO2 Thin Films Advanced Functional Materials. ,vol. 22, pp. 2412- 2417 ,(2012) , 10.1002/ADFM.201103119