Degradation Kinetics in Cu 0.1 Ni 0.1 Co 1.6 Mn 1.2 O 4 -based ceramic materials
作者： Halyna Klym , Ivan Karbovnyk , Dmytro Lukashevych , Yuriy Kostiv
DOI: 10.1109/UKRMICO47782.2019.9165493
关键词:
摘要: … transformation of the main electrical characteristics of thick films is particularly relevant [8,9]. … Kostiv, “Nanostructural free-volume effects in humidity-sensitive MgOAl2O3 ceramics for …
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